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  • BSI
    PD IEC/TR 61967-1-1:2010 Integrated circuits. Measurement of electromagnetic emissions - General conditions and definitions. Near-field scan data exchange format
    Edition: 2010
    $511.56
    / user per year

Description of PD IEC/TR 61967-1-1:2010 2010

This part of IEC 61967 provides guidance for exchanging data generated by near-field scan measurements.

The described exchange format could also be used for near-field scan data generated by simulation software.

It should be noted that, although it has been developed for near-field scan, its use is not restricted to this application.

The exchange format can be applied to emission, immunity and impulse immunity near-field scan data in the frequency and time domains.

The scope of this technical report includes neither the methods used for the measurements or simulations, nor the software and algorithms used for generating the exchange file or for processing or viewing the data contained therein.



Standard NumberPD IEC/TR 61967-1-1:2010
TitleIntegrated circuits. Measurement of electromagnetic emissions - General conditions and definitions. Near-field scan data exchange format
StatusWithdrawn
Publication Date2010-06-30
Withdrawn Date2015-09-30
Identical National Standard OfIEC TR 61967-1-1:2010
DescriptorsElectrical measurement, Data transfer, Integrated circuits, Electronic equipment and components, Information exchange, Data processing, Electromagnetic fields, Emission, Data representation, Electromagnetic radiation, Noise (spurious signals), Circuits, Radio disturbances, XML
ICS31.200 Integrated circuits. Microelectronics
CommitteeEPL/47
ISBN978 0 580 68979 6
PublisherBSI
Pages56



About BSI

BSI Group, also known as the British Standards Institution is the national standards body of the United Kingdom. BSI produces technical standards on a wide range of products and services and also supplies certification and standards-related services to businesses.
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