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IEEE Recommended Practice for Inertial Sensor Test Equipment, Instrumentation, Data Acquisition, and Analysis, 2005
- IEEE Std 1554™-2005, IEEE Recommended Practice for Inertial Sensor Test Equipment, Instrumentation, Data Acquisition, and Analysis
- Title page
- Introduction
- Notice to users [Go to Page]
- Errata
- Interpretations
- Patents
- Participants
- CONTENTS
- 1. Overview [Go to Page]
- 1.1 Scope
- 1.2 Purpose
- 2. Normative references [Go to Page]
- 2.1 IEEE standards
- 2.2 ISO standards
- 2.3 Nuclear radiation test standards
- 3. Test planning [Go to Page]
- 3.1 Classification of tests
- 3.2 Calibrated parameter characteristics
- 3.3 Test plan outline
- 3.4 Test station log book
- 4. General equipment [Go to Page]
- 4.1 Calibration of equipment
- 4.2 Test station power supplies and grounds
- 4.3 Time and frequency standard
- 4.4 Precision voltage reference
- 4.5 Voltmeters
- 4.6 Ammeters and wattmeters
- 4.7 Resistance references
- 4.8 Magnetic field shielding
- 4.9 Magnetic field generation and measurement
- 4.10 Frequency synthesizers
- 4.11 Oscilloscopes
- 4.12 Spectrum analyzer
- 4.13 Signal analyzer
- 4.14 Voltage- or current-to-frequency converters
- 4.15 Frequency counters
- 4.16 Temperature controllers
- 4.17 Temperature-monitoring equipment
- 4.18 Bubble levels and tilt meters
- 4.19 Autocollimator
- 4.20 Displacement measurement systems
- 4.21 Other general commercial equipment
- 4.22 Specially built equipment
- 5. Sensor-specific equipment
- 6. Mounting fixture [Go to Page]
- 6.1 Fixture mechanical design
- 6.2 Thermal control of fixture
- 6.3 Vibration fixture
- 6.4 Centrifuge fixture
- 6.5 Radiation test fixture
- 7. Test piers [Go to Page]
- 7.1 Location of test piers
- 7.2 Vibration environment of test pier
- 7.3 Tilt and azimuth motion of test pier
- 7.4 Active control of test pad
- 8. Accelerometer dividing heads (or turntables) [Go to Page]
- 8.1 Use of accelerometer dividing heads
- 8.2 Placement of dividing head
- 8.3 Thermal control on dividing head
- 8.4 Alignment of dividing head and mounting fixture
- 8.5 Wiring to dividing head
- 8.6 Rotation of dividing head
- 8.7 Readout of dividing head angles
- 9. Rate tables [Go to Page]
- 9.1 Use of rate tables
- 9.2 Single-axis rate table
- 9.3 Two-axis rate table
- 9.4 Three-axis rate tables for inertial sensor assembly (ISA) te
- 10. Vibration and shock equipment [Go to Page]
- 10.1 Use of vibration and shock machines
- 10.2 Vibrators
- 10.3 Drop shock and hammer shock machines
- 10.4 Air guns
- 10.5 Shock and vibration monitors
- 11. Centrifuge [Go to Page]
- 11.1 Use of centrifuges
- 11.2 Lesser accuracy and high-speed centrifuges
- 11.3 Precision centrifuge
- 11.4 Double turntable centrifuge
- 11.5 Centrifuge instrumentation
- 11.6 Other rotating inertial sensor test equipment
- 12. Environmental chambers [Go to Page]
- 12.1 Thermal control on a test table, vibrator, or centrifuge
- 12.2 Refrigerated and heated chambers
- 12.3 Barometric chambers
- 12.4 Equipment for electromagnetic susceptibility and emissions t
- 12.5 Acoustic absorption and generation
- 12.6 Other environmental chambers
- 13. Nuclear radiation effects testing [Go to Page]
- 13.1 Use of nuclear radiation testing
- 13.2 Basis of radiation testing requirements (radiation effects)
- 13.3 TID effects testing
- 13.4 Ionizing dose rate effects testing
- 13.5 Displacement damage effects testing (neutron and protons)
- 13.6 SEE testing
- 13.7 TME testing
- 14. Counter and frequency readouts [Go to Page]
- 14.1 Counters and continuous counters
- 14.2 Period readouts
- 14.3 Frequency readouts
- 14.4 Phase-locked loops (PLLs)
- 14.5 Other ways of reading out frequency
- 15. A/D conversion readouts [Go to Page]
- 15.1 Commercial voltmeters
- 15.2 A/D converters
- 15.3 Voltage- and current-to-frequency converters
- 16. Temperature monitoring [Go to Page]
- 16.1 General comments
- 16.2 Calibration of temperature readout
- 16.3 Types of temperature monitors
- 17. Other monitoring and commanding [Go to Page]
- 17.1 Analog input signals and signal conditioning
- 17.2 Analog output signals
- 17.3 Asynchronous interfaces
- 17.4 Digital input and output signals
- 17.5 Microprocessor interfaces
- 17.6 IEEE 488 bus
- 17.7 Other interface buses
- 17.8 Radio telemetry interfaces
- 18. Computer data acquisition, control, filtering, and storage [Go to Page]
- 18.1 Real-time operation
- 18.2 Initialization and running of test
- 18.3 Interfaces to computer backplane
- 18.4 Experiment control and automatic test equipment
- 18.5 Acquired signals
- 18.6 Event recording
- 18.7 Real-time digital filtering
- 18.8 Data storage
- 18.9 Data transmission
- 19. Data analysis [Go to Page]
- 19.1 Data file format
- 19.2 Plots versus time
- 19.3 Plots of one channel versus another
- 19.4 Polynomial and other linear least-squares-fit residual plots
- 19.5 Power spectral density (PSD)
- 19.6 Allan variance
- 19.7 Noise processes
- 19.8 Time series to verify PSD and Allan variance software
- 19.9 Allan variance autofit procedure
- 19.10 Regression analysis and cross PSD
- 19.11 Parameter estimation
- 19.12 Analysis of gyroscope and accelerometer drift data
- 19.13 Analysis of data with varying test conditions
- 19.14 Database of test results
- 20. Geophysics instrumentation [Go to Page]
- 20.1 Gravimeters
- 20.2 Tilt and azimuth motion
- 20.3 Seismometers
- 20.4 Gyrocompass
- 20.5 Surveying and global positioning system (GPS) positioning
- 20.6 Star sightings
- 21. Calibration of test equipment and instrumentation [Go to Page]
- 21.1 Site coordinates, gravity, and components of earth’s rotatio
- 21.2 Time and frequency references
- 21.3 Calibration of electrical equipment
- 21.4 Calibration of temperature-measuring instrumentation
- 21.5 Calibration of other equipment
- Annex A (informative) Bibliography [Go to Page]
