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IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters (Published), 2023
- IEEE Std 1241-2023 Front Cover
- Title page
- Important Notices and Disclaimers Concerning IEEE Standards Documents [Go to Page]
- Notice and Disclaimer of Liability Concerning the Use of IEEE Standards Documents
- Translations
- Official statements
- Comments on standards
- Laws and regulations
- Data privacy
- Copyrights
- Photocopies
- Updating of IEEE Standards documents
- Errata
- Patents
- IMPORTANT NOTICE
- Participants
- Introduction [Go to Page]
- Acknowledgements
- Contents
- 1. Overview [Go to Page]
- 1.1 Scope
- 1.2 Purpose
- 1.3 Word usage
- 1.4 Document organization
- 1.5 Analog-to-digital converter background
- 1.6 Guidance to the user [Go to Page]
- 1.6.1 Interfacing
- 1.6.2 Test conditions
- 1.6.3 Electrical environment
- 1.6.4 Test equipment
- 1.6.5 Test selection
- 1.7 Manufacturer-supplied information [Go to Page]
- 1.7.1 General information
- 1.7.2 Minimum specifications
- 1.7.3 Additional specifications
- 1.7.4 Pertinent ADC parameters
- 2. Normative references
- 3. Definitions, acronyms, and abbreviations [Go to Page]
- 3.1 Definitions
- 3.2 Acronyms, abbreviations, and symbols [Go to Page]
- 3.2.1 Acronyms, abbreviations, and operators
- 3.2.2 Symbols
- 4. General test methods [Go to Page]
- 4.1 Introductory information on test methods
- 4.2 Test setup [Go to Page]
- 4.2.1 Sine-wave test setup
- 4.2.2 Arbitrary signal test setup
- 4.2.3 Step signal setup
- 4.3 Taking a record of data [Go to Page]
- 4.3.1 Use of output decimation in taking a record of data
- 4.4 Equivalent-time sampling and undersampling [Go to Page]
- 4.4.1 Extraction method
- 4.4.2 Comments on the extraction method for equivalent-time sampling
- 4.4.3 Alternate extraction method
- 4.4.4 Comments on alternate extraction method
- 5. Sine-wave testing and fitting [Go to Page]
- 5.1 Introductory information on sine-wave testing and fitting
- 5.2 Curve fitting test method
- 5.3 Comment on three-parameter versus four-parameter sine fit
- 5.4 Choice of frequencies and waveform epoch [Go to Page]
- 5.4.1 Fine-scale frequency selection
- 5.4.2 Medium-scale frequency selection
- 5.4.3 Coarse-scale frequency selection
- 5.4.4 Special considerations with very long waveform epochs
- 5.5 Selecting signal amplitudes
- 5.6 Presenting sine-wave data
- 5.7 Impurities of sine-wave sources
- 5.8 Estimating impurity problems from sine-fitting results
- 5.9 Measuring and controlling sine-wave impurities
- 6. Locating code transitions [Go to Page]
- 6.1 Introductory information on locating code transitions
- 6.2 Locating code transitions using a feedback loop [Go to Page]
- 6.2.1 Test method for locating code transitions using a feedback loop
- 6.3 Alternate code transition location method based on ramp histogram [Go to Page]
- 6.3.1 Comments on number of samples to be averaged per CTL for a given confidence level
- 6.3.2 Comments on ramp characteristics
- 6.3.3 Comments on histogram testing
- 6.4 Alternate code transition location method, based on sine-wave histogram [Go to Page]
- 6.4.1 Tolerance and confidence level
- 6.4.2 Comment on the selection of the sine-wave frequency and waveform epoch
- 6.4.3 Comments on sine-wave histogram testing
- 6.4.4 Comment on the amount of sine-wave overdrive and the number of waveforms epochs required [Go to Page]
- 6.4.4.1 Input overdrive and required number of waveforms
- 6.5 Determining the static transfer curve [Go to Page]
- 6.5.1 Alternate method for determining the static transfer curve
- 7. Analog input [Go to Page]
- 7.1 Input characteristics [Go to Page]
- 7.1.1 Static input resistance
- 7.2 Static input impedance versus input signal level [Go to Page]
- 7.2.1 Test method for static input impedance
- 7.3 Static input current
- 7.4 Static gain and offset [Go to Page]
- 7.4.1 Static gain and offset (independently based) [Go to Page]
- 7.4.1.1 Alternate method for determining gain and offset
- 7.4.2 Static gain and offset (terminal based)
- 8. Linearity [Go to Page]
- 8.1 General comments on linearity
- 8.2 Integral nonlinearity [Go to Page]
- 8.2.1 Integral nonlinearity test method
- 8.2.2 Alternate test method for determining INL
- 8.3 Absolute accuracy error [Go to Page]
- 8.3.1 Test method for absolute accuracy error
- 8.4 Differential nonlinearity and missing codes [Go to Page]
- 8.4.1 Differential nonlinearity and missing codes test method
- 8.5 Example INL and DNL data
- 8.6 Monotonicity [Go to Page]
- 8.6.1 Test method for monotonicity
- 8.7 Hysteresis [Go to Page]
- 8.7.1 Hysteresis test method
- 8.7.2 Alternate hysteresis test method
- 8.7.3 Comment on hysteresis and alternation
- 8.8 Harmonic and spurious distortion [Go to Page]
- 8.8.1 Total harmonic distortion [Go to Page]
- 8.8.1.1 Coherent sampling THD test method
- 8.8.1.2 Noncoherent sampling test method 1 (windowed DFT)
- 8.8.1.3 Noncoherent sampling test method 2 (sine fitting)
- 8.8.1.4 Comments on waveform lengths, sample rate, and input frequency for noncoherent sampling using curve fitting
- 8.8.2 Spurious free dynamic range [Go to Page]
- 8.8.2.1 Coherent sampling SFDR test method
- 8.8.2.2 Noncoherent SFDR sampling test method
- 8.9 Intermodulation distortion [Go to Page]
- 8.9.1 Intermodulation distortion test method using two tones [Go to Page]
- 8.9.1.1 Comments on test procedure
- 8.9.1.2 Additional comments
- 8.9.2 Intermodulation distortion test methods using more than two tones [Go to Page]
- 8.9.2.1 Multi-tone power ratio
- 8.9.2.2 MTPR test method
- 8.9.2.3 Comments on MTPR
- 8.10 Noise power ratio [Go to Page]
- 8.10.1 Test method for noise power ratio
- 8.10.2 NPR testing issues [Go to Page]
- 8.10.2.1 Input signal filtering
- 8.10.2.2 Notch filter width
- 8.10.2.3 Windowing
- 8.10.2.4 Measured and theoretical NPR
- 8.10.2.5 Comments on NPR
- 9. Noise (total) [Go to Page]
- 9.1 General comments concerning noise
- 9.2 Signal-to-noise-and-distortion ratio (SINAD) [Go to Page]
- 9.2.1 SINAD test method
- 9.2.2 Coherent sampling test method for SINAD in the frequency domain
- 9.2.3 Comments on SINAD and SNR
- 9.3 Signal-to-noise ratio (SNR) [Go to Page]
- 9.3.1 Coherent sampling test method for SNR
- 9.3.2 Noncoherent sampling test method 1 (windowed DFT)
- 9.3.3 Noncoherent sampling test method 2 (sine fitting)
- 9.4 Effective number of bits (ENOB) [Go to Page]
- 9.4.1 Comment on ideal quantization error
- 9.4.2 Comment on the relationship of SINAD and ENOB
- 9.4.3 Comment on significance of number of samples, M
- 9.4.4 Comment on effects of jitter or phase noise on sine-wave tests
- 9.5 Random noise [Go to Page]
- 9.5.1 Test method for random noise
- 9.5.2 Alternative test method for low noise ADCs [Go to Page]
- 9.5.2.1 Note on amplitude of triangle wave used for test
- 9.5.2.2 Note on desired accuracy
- 9.5.3 Alternative random noise and hysteresis test method based on a feedback loop
- 10. Step response parameters [Go to Page]
- 10.1 Step response definition
- 10.2 Test method for acquiring an estimate of the step response [Go to Page]
- 10.2.1 Comment on test results
- 10.3 Slew rate limit [Go to Page]
- 10.3.1 Test method
- 10.4 Settling time parameters [Go to Page]
- 10.4.1 Settling time
- 10.4.2 Short-term settling time
- 10.4.3 Long-term settling error
- 10.4.4 Test method for settling time and short-term settling time
- 10.4.5 Comment on settling time
- 10.5 Transition duration of step response [Go to Page]
- 10.5.1 Test method for transition duration
- 10.6 Overshoot and precursors [Go to Page]
- 10.6.1 Test method for overshoot and precursors
- 11. Frequency response parameters [Go to Page]
- 11.1 Bandwidth [Go to Page]
- 11.1.1 Bandwidth test method
- 11.1.2 Alternative bandwidth test method using time domain techniques
- 11.1.3 Useful power bandwidth test method
- 11.2 Gain error (gain flatness)
- 11.3 Frequency response and gain from step response [Go to Page]
- 11.3.1 Frequency response and dynamic gain test method
- 11.3.2 Aliasing and first differencing error bounds
- 11.3.3 Comment on frequency response tests
- 12. Differential gain and phase [Go to Page]
- 12.1 Introductory information on differential gain and phase
- 12.2 Method for testing a general-purpose ADC [Go to Page]
- 12.2.1 Method for neglecting phase adjustment factor
- 12.3 Comments on differential phase and differential gain testing
- 13. Sampling aperture effects [Go to Page]
- 13.1 Introductory information on sampling aperture effects
- 13.2 Aperture duration [Go to Page]
- 13.2.1 Test method for aperture duration
- 13.2.2 Comment on selecting the value of p
- 13.3 Aperture delay [Go to Page]
- 13.3.1 Test method for aperture delay
- 13.3.2 Comment on aperture delay
- 13.4 Aperture uncertainty [Go to Page]
- 13.4.1 Test method for aperture uncertainty
- 14. Additional tests and specification [Go to Page]
- 14.1 Digital logic signals
- 14.2 Pipeline delay
- 14.3 Out-of-range recovery interval [Go to Page]
- 14.3.1 Test method for absolute out-of-range recovery
- 14.3.2 Test method for relative out-of-range recovery
- 14.3.3 Comments on test methods
- 14.4 Differential input specifications [Go to Page]
- 14.4.1 Input impedance to ground (for differential input ADCs) [Go to Page]
- 14.4.1.1 Test method
- 14.4.2 Common-mode rejection ratio (CMRR) and maximum common-mode signal level [Go to Page]
- 14.4.2.1 Test method for CMRR
- 14.4.3 Maximum operating common-mode signal [Go to Page]
- 14.4.3.1 Test method for maximum operating common-mode signal
- 14.4.4 Common-mode out-of-range recovery interval [Go to Page]
- 14.4.4.1 Test method for common-mode out-of-range recovery time
- 14.5 Comments on reference signals
- 14.6 Power supply parameters [Go to Page]
- 14.6.1 Power consumption [Go to Page]
- 14.6.1.1 Power consumption test method
- 14.6.1.2 Power supply voltage effects
- 14.6.1.3 Power supply voltage effects test method
- 14.6.1.4 Comments on power supply rejection ratio (PSRR)
- Annex A (informative) ADC architectures [Go to Page]
- A.1 Integrating ADCs
- A.2 Flash ADCs
- A.3 Pipelined and subranging ADCs
- A.4 SAR ADCs
- A.5 Σ-∆ ADCs
- A.6 Time-interleaved ADCs
- A.7 Folding and interpolating ADCs
- Annex B (informative) Sine-wave fitting algorithms [Go to Page]
- B.1 Algorithm for three-parameter (known frequency) least-squares fit to sine-wave data
- B.2 Algorithm for four-parameter least-squares fit to sine-wave data
- Annex C (normative) Discrete Fourier transforms and windowing [Go to Page]
- C.1 Windowed DFT and spectral leakage [Go to Page]
- C.1.1 Spectral leakage
- C.1.2 Coherent sampling and sine-fitting methods of reducing spectral leakage
- C.2 Some useful windows and their characteristics
- C.3 Window selection
- Annex D (informative) Presentation of sine-wave data [Go to Page]
- D.1 ENOB presentation
- D.2 Presentation of residuals
- D.3 Other examples of presentations of sine-wave test results
- Annex E (informative) Bibliography
- Back Cover [Go to Page]
