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IEC/TR 61000-1-1 Ed. 2.0 en:2023 Electromagnetic compatibility (EMC) - Part 1-1: General - Application and interpretation of fundamental definitions and terms, 2023
- CONTENTS
- FOREWORD
- 1 Scope
- 2 Normative references
- 3 Terms, definitions and abbreviated terms [Go to Page]
- 3.1 Terms and definitions
- 3.2 Abbreviated terms
- 4 The electromagnetic environment [Go to Page]
- 4.1 General
- 4.2 Coupling between emitting and susceptible devices
- 5 Application of EMC terms and definitions [Go to Page]
- 5.1 General
- 5.2 Relation between various types of levels [Go to Page]
- 5.2.1 Emissions and immunity level (and limit)
- 5.2.2 Compatibility level
- 5.2.3 Examples to illustrate the concepts of using levels and limits
- 5.3 Probability aspects and margins [Go to Page]
- 5.3.1 Compatibility levels and uncertainties
- 5.3.2 Standardized test
- 5.3.3 In situ test – Superposition
- 5.3.4 Lack of data
- 6 Models and their limitations [Go to Page]
- 6.1 General
- 6.2 Source models [Go to Page]
- 6.2.1 Conducted emissions
- 6.2.2 Radiated emissions
- 6.3 Coupling models [Go to Page]
- 6.3.1 General
- 6.3.2 Common impedance coupling
- 6.3.3 Coupling by induction
- 6.3.4 Radiative coupling
- 6.4 Susceptible device models
- Annex A (informative)Interpretation of EMC terms and definitions [Go to Page]
- A.1 General
- A.2 Units and decibels
- A.3 Electromagnetic interference, compatibility and environment [Go to Page]
- A.3.1 General
- A.3.2 Electromagnetic interference (EMI)
- A.3.3 Electromagnetic compatibility (EMC)
- A.3.4 The electromagnetic environment
- A.4 Susceptibility/immunity
- A.5 Level and limit
- A.6 Emission and immunity
- A.7 Compatibility level and margin
- Annex B (informative)Standardized and in situ tests
- Annex C (informative)Review of the historical assignment of radiated disturbance degrees [Go to Page]
- C.1 General
- C.2 Theoretical analysis of radiated disturbance degrees
- C.3 Detailed derivations [Go to Page]
- C.3.1 Derivation of Formula (C.4)
- C.3.2 Derivation of Formula (C.5)
- Bibliography
- Figures [Go to Page]
- Figure 1 – Coupling paths between emitting and susceptible devices
- Figure 2 – Limits and levels for a single emitter and susceptible deviceas a function of some independent variable (e.g., frequency)
- Figure 3 – Emission/immunity limits and compatibility levels, with an example of emission/immunity levels for a single emitter and susceptible device as a functionof some independent variable (e.g., frequency)
- Figure 4 – Compatibility levels Uc for the odd harmonics in a public low-voltage network and examples of associated emission and immunity limits
- Figure 5 – Limits, compatibility levels and margins, as a functionof any independent variable (e.g., frequency)
- Figure 6 – Example of the probability densities for an emission level andan immunity level, at one single value of the independent variable
- Figure 7 – Example of superposition of disturbances
- Figure 8 – Example of probability densities for an ultimate disturbance level(the sum of disturbance levels produced by various emitters) and the immunitylevels of two types of susceptible device
- Figure 9 – Source model for conducted emissions(source loaded by ZL1 and ZL2)
- Figure 10 – Electric and magnetic dipole elements
- Figure 11 – Capacitance per unit length as a function of conductor separation
- Figure 12 – Flux density from parallel conductors
- Figure A.1 – The basic form of an EMI problem
- Figure A.2 – Subdivision of EMC in its key aspects
- Figure A.3 – Overview of various EMC terms and measuring conditions
- Figure A.4 – Examples of probability densities p(D), p(I) and the resulting p(I – D)
- Figure C.1 – Problem geometry
- Table C.1 – Radiated disturbance degrees [Go to Page]
