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Download File
eLibrary >
IEC 60122-1 Ed. 3.1 en:2017 Quartz crystal units of assessed quality - Part 1: Generic specification >
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TOC Search:
IEC 60122-1 Ed. 3.1 en:2017 Quartz crystal units of assessed quality - Part 1: Generic specification, 2017
- Redline version [Go to Page]
- CONTENTS
- FOREWORD
- 1 General [Go to Page]
- 1.1 Scope
- 1.2 Normative references
- 1.3 Order of precedence
- 2 Terminology and general requirements [Go to Page]
- 2.1 General
- 2.2 Terms, definitions and classification of phenomena
- 2.3 Preferred ratings and characteristics [Go to Page]
- 2.3.1 Temperature ranges in degrees Celsius (oC) suitable for ambient operation
- 2.3.2 Elevated temperature ranges in degrees Celsius (oC) suitable for oven control
- 2.3.3 Frequency tolerance (1×10–6)
- 2.3.4 Circuit conditions
- 2.3.5 Levels of drive
- 2.3.6 Drive level dependency
- 2.3.7 Climatic category
- 2.3.8 Bump severity
- 2.3.9 Vibration severity
- 2.3.10 Shock severity
- 2.3.11 Leak rate
- 2.4 Marking
- 3 Quality assessment procedures [Go to Page]
- 3.1 Primary stage of manufacture
- 3.2 Structurally similar components
- 3.3 Subcontracting
- 3.4 Manufacturer’s approval
- 3.5 Approval procedures [Go to Page]
- 3.5.1 General
- 3.5.2 Capability approval
- 3.5.3 Qualification approval
- 3.6 Procedures for capability approval [Go to Page]
- 3.6.1 General
- 3.6.2 Eligibility for capability approval
- 3.6.3 Application for capability approval
- 3.6.4 Granting of capability approval
- 3.6.5 Capability manual
- 3.7 Procedures for qualification approval [Go to Page]
- 3.7.1 General
- 3.7.2 Eligibility for qualification approval
- 3.7.3 Application for qualification approval
- 3.7.4 Granting of qualification approval
- 3.7.5 Quality conformance inspection
- 3.8 Test procedures
- 3.9 Screening requirements
- 3.10 Rework and repair work [Go to Page]
- 3.10.1 Rework
- 3.10.2 Repair work
- 3.11 Certified records of released lots
- 3.12 Validity of release
- 3.13 Release for delivery
- 3.14 Unchecked parameters
- 4 Test and measurement procedures [Go to Page]
- 4.1 General
- 4.2 Alternative test methods
- 4.3 Precision of measurement
- 4.4 Standard conditions for testing
- 4.5 Visual inspection [Go to Page]
- 4.5.1 Visual test A
- 4.5.2 Visual test B
- 4.5.3 Visual test C
- 4.6 Dimensioning and gauging procedures [Go to Page]
- 4.6.1 Dimensions, test A
- 4.6.2 Dimensions, test B
- 4.7 Electrical test procedures [Go to Page]
- 4.7.1 Frequency and resonance resistance
- 4.7.2 Drive level dependency
- 4.7.3 Frequency and resonance resistance as a function of temperature
- 4.7.4 Unwanted responses
- 4.7.5 Shunt capacitance
- 4.7.6 Load resonance frequency and resistance
- 4.7.7 Frequency pulling range (fL1, fL2)
- 4.7.8 Motional parameters
- 4.7.9 Insulation resistance
- 4.8 Mechanical and environmental test procedures [Go to Page]
- 4.8.1 Robustness of terminations (destructive)
- 4.8.2 Sealing tests (non-destructive)
- 4.8.3 Soldering (solderability and resistance to soldering heat) (destructive)
- 4.8.4 Rapid change of temperature, two-fluid bath method (non-destructive)
- 4.8.5 Rapid change of temperature with prescribed time of transition (non-destructive)
- 4.8.6 Bump (destructive)
- 4.8.7 Vibration (destructive)
- 4.8.8 Shock (destructive)
- 4.8.9 Free fall (destructive)
- 4.8.10 Acceleration, steady state (non-destructive)
- 4.8.11 Dry heat (non-destructive)
- 4.8.12 Damp heat, cyclic (destructive)
- 4.8.13 Cold (non-destructive)
- 4.8.14 Climatic sequence (destructive)
- 4.8.15 Damp heat, steady state (destructive)
- 4.8.16 Immersion in cleaning solvents (non-destructive)
- 4.9 Endurance test procedure [Go to Page]
- 4.9.1 Standard ageing test for production verification
- 4.9.2 Accelerated aging
- 4.9.3 Reference aging test
- 4.9.4 Extended ageing
- Annex A (normative) Procedure for the determination of the fitting parameters for the frequency aging
- Bibliography
- Figures [Go to Page]
- Figure 1 – Symbol and equivalent electrical circuit of a piezoelectric resonator
- Figure 2 – Impedance |Z|, resistance Re, reactance Xe, series arm reactance X1 of a piezoelectric resonator as a function of frequency
- Figure 3 – Impedance and admittance diagram of a piezoelectric resonator
- Figure 4 – Resonance, anti-resonance and load resonance frequencies
- Figure 5 – Equivalent circuit of a piezoelectric resonator with a series (load) capacitance CL
- Figure 6 – Terminal bend test tool
- Tables [Go to Page]
- Table 1 – List of symbols used for the equivalent electric circuit of a piezoelectric resonator
- Table 2 – Solutions for the various characteristic frequencies
- Table 3 – Minimum values for the ratio Q2/r to be expected for various types of piezoelectric resonators
- Table 4 – Approximate relations between the characteristic frequencies and the series resonance frequency fs of a piezoelectric resonator
- Table 5 – Time acceleration factors for Ea = 0,38 eV
- Table A.1 – Procedure for the determination of the frequency aging parameters
- Final version [Go to Page]
- CONTENTS
- FOREWORD
- 1 General [Go to Page]
- 1.1 Scope
- 1.2 Normative references
- 1.3 Order of precedence
- 2 Terminology and general requirements [Go to Page]
- 2.1 General
- 2.2 Terms, definitions and classification of phenomena
- 2.3 Preferred ratings and characteristics [Go to Page]
- 2.3.1 Temperature ranges in degrees Celsius (oC) suitable for ambient operation
- 2.3.2 Elevated temperature ranges in degrees Celsius (oC) suitable for oven control
- 2.3.3 Frequency tolerance (1×10–6)
- 2.3.4 Circuit conditions
- 2.3.5 Levels of drive
- 2.3.6 Drive level dependency
- 2.3.7 Climatic category
- 2.3.8 Bump severity
- 2.3.9 Vibration severity
- 2.3.10 Shock severity
- 2.3.11 Leak rate
- 2.4 Marking
- 3 Quality assessment procedures [Go to Page]
- 3.1 Primary stage of manufacture
- 3.2 Structurally similar components
- 3.3 Subcontracting
- 3.4 Manufacturer’s approval
- 3.5 Approval procedures [Go to Page]
- 3.5.1 General
- 3.5.2 Capability approval
- 3.5.3 Qualification approval
- 3.6 Procedures for capability approval [Go to Page]
- 3.6.1 General
- 3.6.2 Eligibility for capability approval
- 3.6.3 Application for capability approval
- 3.6.4 Granting of capability approval
- 3.6.5 Capability manual
- 3.7 Procedures for qualification approval [Go to Page]
- 3.7.1 General
- 3.7.2 Eligibility for qualification approval
- 3.7.3 Application for qualification approval
- 3.7.4 Granting of qualification approval
- 3.7.5 Quality conformance inspection
- 3.8 Test procedures
- 3.9 Screening requirements
- 3.10 Rework and repair work [Go to Page]
- 3.10.1 Rework
- 3.10.2 Repair work
- 3.11 Certified records of released lots
- 3.12 Validity of release
- 3.13 Release for delivery
- 3.14 Unchecked parameters
- 4 Test and measurement procedures [Go to Page]
- 4.1 General
- 4.2 Alternative test methods
- 4.3 Precision of measurement
- 4.4 Standard conditions for testing
- 4.5 Visual inspection [Go to Page]
- 4.5.1 Visual test A
- 4.5.2 Visual test B
- 4.5.3 Visual test C
- 4.6 Dimensioning and gauging procedures [Go to Page]
- 4.6.1 Dimensions, test A
- 4.6.2 Dimensions, test B
- 4.7 Electrical test procedures [Go to Page]
- 4.7.1 Frequency and resonance resistance
- 4.7.2 Drive level dependency
- 4.7.3 Frequency and resonance resistance as a function of temperature
- 4.7.4 Unwanted responses
- 4.7.5 Shunt capacitance
- 4.7.6 Load resonance frequency and resistance
- 4.7.7 Frequency pulling range (fL1, fL2)
- 4.7.8 Motional parameters
- 4.7.9 Insulation resistance
- 4.8 Mechanical and environmental test procedures [Go to Page]
- 4.8.1 Robustness of terminations (destructive)
- 4.8.2 Sealing tests (non-destructive)
- 4.8.3 Soldering (solderability and resistance to soldering heat) (destructive)
- 4.8.4 Rapid change of temperature, two-fluid bath method (non-destructive)
- 4.8.5 Rapid change of temperature with prescribed time of transition (non-destructive)
- 4.8.6 Bump (destructive)
- 4.8.7 Vibration (destructive)
- 4.8.8 Shock (destructive)
- 4.8.9 Free fall (destructive)
- 4.8.10 Acceleration, steady state (non-destructive)
- 4.8.11 Dry heat (non-destructive)
- 4.8.12 Damp heat, cyclic (destructive)
- 4.8.13 Cold (non-destructive)
- 4.8.14 Climatic sequence (destructive)
- 4.8.15 Damp heat, steady state (destructive)
- 4.8.16 Immersion in cleaning solvents (non-destructive)
- 4.9 Endurance test procedure [Go to Page]
- 4.9.1 Standard ageing test for production verification
- 4.9.2 Accelerated aging
- 4.9.3 Reference aging test
- 4.9.4 Extended ageing
- Annex A (normative) Procedure for the determination of the fitting parameters for the frequency aging
- Bibliography
- Figures [Go to Page]
- Figure 1 – Symbol and equivalent electrical circuit of a piezoelectric resonator
- Figure 2 – Impedance |Z|, resistance Re, reactance Xe, series arm reactance X1 of a piezoelectric resonator as a function of frequency
- Figure 3 – Impedance and admittance diagram of a piezoelectric resonator
- Figure 4 – Resonance, anti-resonance and load resonance frequencies
- Figure 5 – Equivalent circuit of a piezoelectric resonator with a series (load) capacitance CL
- Figure 6 – Terminal bend test tool
- Tables [Go to Page]
- Table 1 – List of symbols used for the equivalent electric circuit of a piezoelectric resonator
- Table 2 – Solutions for the various characteristic frequencies
- Table 3 – Minimum values for the ratio Q2/r to be expected for various types of piezoelectric resonators
- Table 4 – Approximate relations between the characteristic frequencies and the series resonance frequency fs of a piezoelectric resonator
- Table 5 – Time acceleration factors for Ea = 0,38 eV
- Table A.1 – Procedure for the determination of the frequency aging parameters [Go to Page]
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