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BS IEC 63211-2-21:2025 Durability test methods for electronic displays - Environmental tests. Test methods for heat and humidity, 2025
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- CONTENTS
- FOREWORD
- INTRODUCTION
- 1 Scope
- 2 Normative references
- 3 Terms, definitions and abbreviated terms [Go to Page]
- 3.1 Terms and definitions
- 3.2 Abbreviated terms
- 4 Standard conditions [Go to Page]
- 4.1 Standard reference atmosphere
- 4.2 Standard atmospheric conditions for measurements and tests
- 4.3 Recovery conditions
- 4.4 Tolerance of operation fluctuations
- 5 Test equipment [Go to Page]
- 5.1 Test chamber
- 5.2 Mounting the test specimen
- 6 Test specimens
- 7 Test conditions [Go to Page]
- 7.1 General
- 7.2 High temperature [Go to Page]
- 7.2.1 Purpose
- 7.2.2 High temperature storage (HTS)
- 7.2.3 High temperature operation (HTO)
- 7.3 Low temperature [Go to Page]
- 7.3.1 Purpose
- 7.3.2 Low temperature storage (LTS)
- 7.3.3 Low temperature operation (LTO)
- 7.4 Damp heat [Go to Page]
- 7.4.1 Purpose
- 7.4.2 Damp heat, steady state, storage (DHSS)
- 7.4.3 Damp heat, steady state, operation (DHSO)
- 7.4.4 Damp heat, cyclic (DHC)
- 7.5 Composite temperature and humidity cyclic (CTHC) [Go to Page]
- 7.5.1 Purpose
- 7.5.2 Temperature, humidity, duration time and temperature change
- 7.6 Temperature change [Go to Page]
- 7.6.1 Purpose
- 7.6.2 Specified change rate of temperature (SCRT)
- 7.6.3 Rapid change of temperature (RCT)
- 8 Test procedure [Go to Page]
- 8.1 General
- 8.2 Test procedures of temperature and humidity test
- Figures [Go to Page]
- Figure 1 – Temperature profile of HTS, HTO
- Figure 2 – Temperature profile of LTS, LTO
- Figure 3 – Temperature and humidity profile of DHSS, DHSO
- 8.3 Test procedures of temperature and humidity cyclic test
- Figure 4 – Temperature and humidity profile of DHC
- Figure 5 – Temperature and humidity profile of temperature and humidity cycle without followed by exposure to cold
- 8.4 Test procedures of temperature change test
- Figure 6 – Temperature and humidity profile of temperature and humidity cycle followed by exposure to cold
- Figure 7 – Temperature profile of SCRT
- Figure 8 – Temperature profile of RCT
- Annex A (informative) Recommended test conditions for different display technologies
- Table A.1 – Test conditions for different display technologies
- Bibliography [Go to Page]
