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Download File
eLibrary >
22/30430766 DC BS EN 60947-10. Low-voltage switchgear and controlgear - Part 10. Semiconductor Circuit-Breakers >
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22/30430766 DC BS EN 60947-10. Low-voltage switchgear and controlgear - Part 10. Semiconductor Circuit-Breakers, 2022
- 121A_489e_CD (1).pdf [Go to Page]
- FOREWORD
- 1 Scope
- 2 Normative references
- 3 Terms, definitions, symbols and reference clauses [Go to Page]
- 3.1 General
- 3.2 General terms and definitions
- 4 Classification [Go to Page]
- 4.1 According to type
- 4.2 According to their selectivity category
- 4.3 According to the method of controlling the operating mechanism:
- 4.4 According to operation on fault conditions
- 4.5 According to the design
- 4.6 According to the method of controlling the operation
- 4.7 According to the provision for maintenance:
- 4.8 According to the provision for software upgrade of embedded software
- 4.9 According to the method of installation
- 4.10 According to communication method and security (to be defined)
- 4.11 According to the lifetime in service
- 4.12 According to the functional supply
- 4.13 According to the degree of protection provided by the enclosure (see 8.1.12 of IEC 60947-1:2020)
- 4.14 According to the direction of current flow and protection [Go to Page]
- 4.14.1 Circuit-breakers protecting only in one direction of current, and enabling the current only in that direction
- 4.14.2 Circuit-breakers protecting only in one direction of current, and enabling the current in both directions
- 4.14.3 Circuit-breakers protecting in both directions of current, and enabling the current in both directions
- 4.15 According to the existence of a stand-by state
- 5 Characteristics of semiconductor circuit-breaker [Go to Page]
- 5.1 Summary of characteristics
- 5.2 Type of circuit-breaker
- 5.3 Rated and limiting values of the main circuit [Go to Page]
- 5.3.1 General
- 5.3.2 Rated voltages [Go to Page]
- 5.3.2.1 Rated operational voltage (Ue)
- 5.3.2.2 Rated insulation voltage (Ui)
- 5.3.2.3 Rated impulse withstand voltage (Uimp)
- 5.3.3 Currents [Go to Page]
- 5.3.3.1 Conventional free-air thermal current (Ith)
- 5.3.3.2 Conventional enclosed thermal current (Ithe)
- 5.3.3.3 Rated current (In)
- 5.3.4 Rated frequency
- 5.3.5 Rated duty
- 5.3.6 Short-circuit characteristics [Go to Page]
- 5.3.6.1 Rated short-circuit making capacity (Icm)
- 5.3.6.2 Rated short-circuit breaking capacities [Go to Page]
- 5.3.6.2.1 General
- 5.3.6.2.2 Rated ultimate short-circuit breaking capacity (Icu)
- 5.3.6.2.3 Rated service short-circuit breaking capacity (Ics)
- 5.3.6.3 Standard relationship between short-circuit making and breaking capacities and related power factor, for AC circuit-breakers
- 5.4 Selectivity categories
- 5.5 Electrical Control Circuits
- 5.6 Auxiliary Circuits
- 5.7 Releases [Go to Page]
- 5.7.1 Release functions
- 5.7.2 Characteristics
- 5.7.3 Current setting of over-current releases
- 5.7.4 Tripping time setting of over-current releases
- 6 Product information [Go to Page]
- 6.1 Nature of the information
- 6.2 Marking
- 6.3 Instructions for installation, operation and maintenance instructions, decommissioning and dismantling
- 7 Normal service, mounting and transport conditions
- 8 Constructional and performance requirements [Go to Page]
- 8.1 Constructional requirements [Go to Page]
- 8.1.1 General
- 8.1.2 Withdrawable circuit-breakers
- 8.1.3 Requirements for isolation function
- 8.1.4 Clearances and creepage distances
- 8.1.5 Requirements for the safety of the operator
- 8.1.6 List of construction breaks
- 8.1.7 Additional requirements for circuit-breakers provided with a neutral pole
- 8.1.8 Digital inputs and outputs for use with programmable logic controllers (PLCs)
- 8.1.9 Indication of the Stand-by position [Go to Page]
- 8.1.9.1 General
- 8.1.9.2 Devices without stand-by position indication
- 8.1.9.3 Devices with stand-by position indication
- 8.2 Information of booting and/or queries to e.g. thermal memory. Performance requirements [Go to Page]
- 8.2.1 Operating conditions [Go to Page]
- 8.2.1.1 Closing [Go to Page]
- 8.2.1.1.1 General
- 8.2.1.2 Opening [Go to Page]
- 8.2.1.2.1 General
- 8.2.1.2.2 Opening by undervoltage release function
- 8.2.1.2.3 Opening by shunt releases function
- 8.2.1.2.4 Opening by over-current function
- 8.2.2 Temperature-rise [Go to Page]
- 8.2.2.1 Temperature-rise limits
- 8.2.2.2 Ambient air temperature
- 8.2.2.3 Main circuit
- 8.2.2.4 Electrical control circuits
- 8.2.2.5 Auxiliary circuits
- 8.2.3 Dielectric properties [Go to Page]
- 8.2.3.1 General
- 8.2.3.2 Impulse withstand voltage
- 8.2.3.3 Power-frequency withstand voltage of the main, auxiliary and control circuits
- 8.2.3.4 Clearances
- 8.2.3.5 Creepage distances
- 8.2.3.6 Solid insulation
- 8.2.3.7 Spacing between separate circuits
- 8.2.4 Ability to make and break under no load, normal load and overload conditions [Go to Page]
- 8.2.4.1 Overload performance
- 8.2.4.2 Operational performance capability
- 8.2.5 Ability to make and break under short-circuit conditions
- 8.2.6 Requirements for isolation function
- 8.3 Electromagnetic compatibility (EMC)
- 9 Tests [Go to Page]
- 9.1 Kind of tests [Go to Page]
- 9.1.1 General
- 9.1.2 Type tests
- 9.1.3 Routine tests
- 9.1.4 Special tests
- 9.2 Compliance with constructional requirements
- 9.3 Type tests [Go to Page]
- 9.3.1 General
- 9.3.2 Test sequences [Go to Page]
- 9.3.2.1 General
- 9.3.2.2 Tests omitted from sequence I and made separately
- 9.3.2.3 Applicability of sequences according to the relationship between short-circuit ratings
- 9.3.2.4 Alternative test programmes for AC circuit-breakers having a different number of poles
- 9.3.3 General test conditions [Go to Page]
- 9.3.3.1 General requirements
- 9.3.3.2 Test quantities [Go to Page]
- 9.3.3.2.1 Values of test quantities
- 9.3.3.2.2 Tolerances on test quantities
- 9.3.3.2.3 Frequency of the test circuit for AC
- 9.3.3.2.4 Power factor Time constant of the test circuit
- 9.3.3.2.5 Time constant of the test circuit
- 9.3.3.2.6 Power-frequency recovery voltage
- 9.3.3.2.7 Ripple of the test current for DC
- 9.3.3.3 Evaluation of test results
- 9.3.3.4 Test reports
- 9.3.3.5 Test conditions for temperature-rise test
- 9.3.3.6 Test conditions for short-circuit tests [Go to Page]
- 9.3.3.6.1 General requirements
- 9.3.3.6.2 Test circuit
- 9.3.3.6.3 Calibration of the test circuit
- 9.3.3.6.4 Test procedure [Go to Page]
- 9.3.3.6.4.1 General
- 9.3.3.6.4.2 Tests on one-, two- and three-pole circuit-breakers
- 9.3.3.6.4.3 Tests on four-pole circuit-breakers
- 9.3.3.6.4.4 Test operations
- 9.3.3.6.5 Behaviour of the circuit-breaker during short-circuit making and breaking tests
- 9.3.3.6.6 Interpretation of records
- 9.3.3.6.7 Verification after short-circuit tests
- 9.3.3.7 Temperature stabilization at the rated current before type tests
- 9.3.4 Test sequence I: General performance characteristics [Go to Page]
- 9.3.4.1 General
- 9.3.4.2 Test of tripping limits and characteristics [Go to Page]
- 9.3.4.2.1 General
- 9.3.4.2.2 I²t withstand
- 9.3.4.2.3 Short-circuit releases
- 9.3.4.2.4 Overload releases
- 9.3.4.2.5 Additional tests for definite time-delay releases
- 9.3.4.2.6 Additional tests for ground-fault overcurrent releases
- 9.3.4.3 Test of dielectric properties
- 9.3.4.4 Verification of withstand to surges
- 9.3.4.5 Tests of mechanical operation and of operational performance capability [Go to Page]
- 9.3.4.5.1 General test conditions
- 9.3.4.5.2 Construction and mechanical operation [Go to Page]
- 9.3.4.5.2.1 Construction
- 9.3.4.5.2.2 Mechanical operation
- 9.3.4.5.2.3 Undervoltage releases
- 9.3.4.5.2.4 Shunt releases
- 9.3.4.5.3 Operational performance capability without current
- 9.3.4.5.4 Operational performance capability with current
- 9.3.4.5.5 Additional test of operational performance capability without current for withdrawable circuit-breakers
- 9.3.4.6 Overload performance
- 9.3.4.7 Short-circuit at ultimate breaking capacity
- 9.3.4.8 Verification of dielectric withstand and leakage current [Go to Page]
- 9.3.4.8.1 General
- 9.3.4.8.2 Test voltage for dielectric withstand
- 9.3.4.8.3 Application of the test voltage for dielectric withstand
- 9.3.4.8.4 Acceptance criteria for dielectric withstand
- 9.3.4.8.5 Leakage current measurement
- 9.3.4.9 Verification of temperature-rise
- 9.3.4.10 Verification of overload releases
- 9.3.4.11 Verification of undervoltage and shunt releases
- 9.3.4.12 Verification of the main contact position
- 9.3.4.13 Verification of the voltage withstand
- 9.3.5 Test sequence II: Rated service short-circuit breaking capacity [Go to Page]
- 9.3.5.1 General
- 9.3.5.2 Test of rated service short-circuit breaking capacity
- 9.3.5.3 Verification of operational performance capability
- 9.3.5.4 Verification of dielectric withstand and leakage current
- 9.3.5.5 Verification of temperature-rise
- 9.3.5.6 Verification of overload releases
- 9.3.6 Test sequence III: Rated ultimate short-circuit breaking capacity [Go to Page]
- 9.3.6.1 General
- 9.3.6.2 Verification of overload releases
- 9.3.6.3 Test of rated ultimate short-circuit breaking capacity
- 9.3.6.4 Verification of dielectric withstand and leakage current
- 9.3.6.5 Verification of overload releases
- 9.3.7 Test sequence IV: Rated short-time withstand current [Go to Page]
- 9.3.7.1 General
- 9.3.7.2 Verification of overload releases
- 9.3.7.3 Test of rated short-time withstand current
- 9.3.7.4 Verification of temperature-rise
- 9.3.7.5 Test of short-circuit breaking capacity at the maximum short-time withstand current
- 9.3.7.6 Verification of dielectric withstand and leakage current
- 9.3.7.7 Verification of overload releases
- 9.3.8 Test sequence V: Performance of integrally fused circuit-breakers [Go to Page]
- 9.3.8.1 General
- 9.3.8.2 Short-circuit at the selectivity limit current
- 9.3.8.3 Verification of temperature-rise
- 9.3.8.4 Verification of dielectric withstand and leakage current
- 9.3.8.5 Verification of overload releases
- 9.3.8.6 Short-circuit at 1,1 times the take-over current
- 9.3.8.7 Short-circuit at rated ultimate short-circuit breaking capacity
- 9.3.8.8 Verification of dielectric withstand and leakage current
- 9.3.8.9 Verification of overload releases
- 9.3.9 Test sequence VI: combined test sequence [Go to Page]
- 9.3.9.1 General
- 9.3.9.2 Verification of overload releases
- 9.3.9.3 Test of rated short-time withstand current
- 9.3.9.4 Test of rated service short-circuit breaking capacity
- 9.3.9.5 Verification of operational performance capability
- 9.3.9.6 Verification of dielectric withstand and leakage current
- 9.3.9.7 Verification of temperature-rise
- 9.3.9.8 Verification of overload releases
- 9.3.10 Critical DC load current test
- 9.3.11 Components tests
- 9.3.12 Test sequence VIII: Rated individual pole ultimate short-circuit breaking capacity at phase-to-neutral AC voltage
- 9.4 Routine tests [Go to Page]
- 9.4.1 General
- 9.4.2 Mechanical operation tests
- 9.4.3 Verification of the calibration of overcurrent releases [Go to Page]
- 9.4.3.1 Inverse time-delay releases
- 9.4.3.2 Instantaneous and definite time-delay releases
- 9.4.4 Verification of the operation of undervoltage and shunt releases [Go to Page]
- 9.4.4.1 Undervoltage releases
- 9.4.4.2 Shunt releases (for opening)
- 9.4.5 Additional tests for CBRs
- 9.4.6 Dielectric tests
- 9.4.7 Test for the verification of clearances less than those corresponding to case A of Table 13 of IEC 60947-1:2020
- 9.5 Special tests – Damp heat, salt mist, vibration and shock
- Annex A (normative) Coordination between a circuit-breaker and another short-circuit protective device associated in the same circuit
- Annex B (normative) Circuit-breakers incorporating residual current protection (under consideration)
- Annex C (normative) Individual pole short-circuit test sequence (under consideration)
- Annex D (normative) Additional requirements for circuit-breakers intended for connection of aluminium conductors
- Annex E (void)
- Annex F (normative) Additional tests for circuit-breakers with electronic overcurrent protection [Go to Page]
- F.1 General
- F.2 List of tests [Go to Page]
- F.2.1 General
- F.2.2 Electromagnetic compatibility (EMC) tests [Go to Page]
- F.2.2.1 General
- F.2.2.2 Performance criteria
- F.2.3 Suitability for multiple frequencies
- F.2.4 Dry heat test
- F.2.5 Damp heat test
- F.2.6 Temperature variation cycles at a specified rate of change
- F.3 General test conditions [Go to Page]
- F.3.1 General
- F.3.2 Electromagnetic compatibility tests
- F.4 Immunity tests [Go to Page]
- F.4.1 Harmonic currents [Go to Page]
- F.4.1.1 General
- F.4.1.2 Test currents
- F.4.1.3 Test procedure
- F.4.1.4 Test results
- F.4.2 Electrostatic discharges
- F.4.3 Radiated RF electromagnetic fields
- F.4.4 Electrical fast transient/burst (EFT/B)
- F.4.5 Surges
- F.4.6 Conducted disturbances induced by RF fields (common mode)
- F.4.7 Current dips [Go to Page]
- F.4.7.1 Test procedure
- F.4.7.2 Test results
- F.5 Emission tests [Go to Page]
- F.5.1 Harmonics
- F.5.2 Voltage fluctuations
- F.5.3 Conducted RF disturbances (150 kHz to 30 MHz)
- F.5.4 Radiated RF disturbances (30 MHz to 1 GHz)
- F.6 Suitability for multiple frequencies [Go to Page]
- F.6.1 General
- F.6.2 Test conditions
- F.6.3 Test procedure
- F.6.4 Test results
- F.7 Dry heat test [Go to Page]
- F.7.1 Test procedure
- F.7.2 Test results
- F.7.3 Verification of overload releases
- F.8 Damp heat test [Go to Page]
- F.8.1 Test procedure
- F.8.2 Verification of overload releases
- F.9 Temperature variation cycles at a specified rate of change [Go to Page]
- F.9.1 Test conditions
- F.9.2 Test procedure
- F.9.3 Test results
- F.9.4 Verification of overload releases
- Annex G (normative) Functional Power (to add to main part) [Go to Page]
- G.1 General
- G.2 Test methods [Go to Page]
- G.2.1 General case
- G.2.2 circuit-breakers of rated current not exceeding 400 A
- G.2.3 DC circuit-breakers
- G.3 Test procedure
- Annex H (normative) Test sequence for circuit-breakers for IT systems [Go to Page]
- H.1 General
- H.2 Individual pole short-circuit
- H.3 Verification of dielectric withstand and leakage current
- H.4 Verification of overload releases
- H.5 Marking
- Annex I (normative) Determination of reliability [Go to Page]
- I.1 General method
- I.2 Reliability
- Annex J (normative) Electromagnetic compatibility (EMC) – Requirements and test methods for circuit-breakers [Go to Page]
- J.1 General
- J.2 Immunity [Go to Page]
- J.2.1 General
- J.2.2 Electrostatic discharges
- J.2.3 Radiated RF electromagnetic fields
- J.2.4 Electrical fast transients/bursts (EFT/B)
- J.2.5 Surges
- J.2.6 Conducted disturbances induced by RF fields (common mode)
- J.3 Emission [Go to Page]
- J.3.1 General
- J.3.2 Conducted RF disturbances (150 kHz to 30 MHz)
- J.3.3 Radiated RF disturbances (30 MHz to 6 000 MHz)
- Annex K (informative) Glossary of symbols and graphical representation of characteristics
- Annex L (normative) Circuit-breakers not fulfilling the requirements for overcurrent protection (under consideration)
- Annex M (normative) Modular residual current devices (without integral current breaking device) (under consideration)
- Annex N (normative) Electromagnetic compatibility (EMC) – Additional requirements and test methods for devices not covered by Annex B, Annex F and Annex M (under consideration)
- Annex O (void)
- Annex P (void)
- Annex Q (void)
- Annex R (void)
- Annex S (normative) Communication protocol
- Bibliography [Go to Page]
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